Components: FlexAFM v5+ Scan Head, C3000i controller, Cantilever Holder Liquid/Air Flat, Cantilever Holder Liquid/Air Flat, Conductive, motorized translation stage 204 ,Isostage 300 antvibration table
Flexible atomic force microscope system for materials research using XYZ tip scanning solution with 100 x 100 x 10 µm3 scanning range. Motorized sample stage with 30 x 30 x 5 mm2 range. Removable cantilever holders with possibility to use conducting cantilevers. The microscope a number of different scanning modes: contact Mode, tapping Mode, phase imaging, conductive AFM, Kelvin probe force microscopy, I-V spectroscopy, lateral force microscopy (LFM), force modulation, magnetic force microscopy, electrostatic force microscopy, piezo response microscopy.